Title
Research and application of built-in self test equipment in integrated circuits
Code
GA102/98/1003
Summary
The project includes theoretical, experimental and application work in the field of diagnostics of digital systems with a special focus on built-in self test BIST equipment The goal of the project is essentially expressed in the following points: Res earch of finite fields which are suitable for use in built-in test pattern generators Finding a methodology of pseudoexhaustive test pattern generator design with reduced number of test patterns without a loss of fault coverage, implementation of the methodology into a design software Proving the designed test pattern generator properties by applying standard diagnostic experiments (ISCAS Benchmarks), comparing the results with existing methods Applying the theoretical results on a prototype in tegrated circuit designed for industrial use Publication of research results, promoting a co-operation with European countries in the field of design and diagnostics of digital systems. Participation in the formulation of IEEE 1 149.4 standard.
Start year
1998
End year
2000
Provider
The Czech Science Foundation
Category
Obecná forma
Type
Standardní projekty
Solver
Information system of research, development and innovation (in Czech)